The width is 1.55650 μm.
A parallel electron beam is focused on the sample in the same manner as in imaging mode to produce diffraction patterns. The beam width transmitted is controlled by a chosen area aperture, and the intermediate lens concentrates the diffraction pattern onto the screen.
Given data:
separating the single slit from the screen = L = 37cm
λ = 564 nm
distance between the first minimum and the central maximum = Z = 2.7mm
We are aware that the destructive diffraction angle is:
θ = pλ/a
where p is the minimum's order, p = 1 for the first minimum, and a is the slit's width, we get the following:
θ = (564nm/a)
We also know that a triangle rectangle can be created, with the distance between the slit and the screen serving as the adjacent cathetus to this angle and the distance between the first maximum and the first minimum serving as the opposite cathetus:
Tg(θ) = Z/L
Tan(564nm/a) = 2.7/37
The same units must first be used on the right side:
2.7mm = 0.27cm
Tg(636nm/a) = 0.27cm/43cm
636nm/a = Atg( 0.27cm/43cm ) = 0.406
a = 636nm/0.406 = 1,556.50nm
1 μm = 1000nm
then:
a = 1,556.50 nm = (1,556.50/1000) μm = 1.55650 μm
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